EP4

Accurion EP4

Our Latest Generation of Imaging Ellipsometers Combines Ellipsometry and Microscopy

Acuurion EP4, our latest imaging ellipsometer, combines ellipsometry and microscopy for precise characterization of thickness and refractive index on micro-structures as small as 1 µm. The microscopic feature provides live-view enhanced contrast, allowing identification of regions of interest and obtaining values for thickness (0.1 nm - 10 µm) and refractive index. The system generates 3D maps of lateral variations within a single measurement. Complementary methods like AFM, QCM-D, reflectometry, and Raman can be integrated for comprehensive observations of the same area. Additional accessories are available to expand measurements under controlled conditions or temperature changes.​

Your Thin Films Visualized

The Accurion EP4 offers a variety of unique features that allow the visualization of your surface in real-time. You will see in real-time the structure of your sample on a microscopic scale. You can measure parameters like thickness, refractive index, and absorption. You can receive maps of selected areas. You can combine the instrument with other technologies like AFM, QCM-D, reflectometry, Raman spectroscopy and many more to receive even more information from your samples. The Accurion EP4 is a modular instrument enabling configuration for your specific measurement tasks. The Accurion EP4, equipped with the standard laser can also be operated as a Brewster angle microscope, typically in LB applications.

  • 01 Graphene, 2D-materials

    Imaging ellipsometry allows the direct visualization of your 2D-material flakes on various substrates/materials. It is possible to measure thickness and optical properties of different 2D-material layers in the micrometer scale.

    01 Graphene, 2D-materials
  • 02 Photonics, Displays, MEMs

    Imaging ellipsometry allows the direct visualization of your 2D-material flakes on various substrates/materials. It is possible to measure thickness and optical properties of different 2D-material layers in the micrometer scale.

    02 Photonics, Displays, MEMs
  • 03 Surface engineering

    The main attempt of silanization is to form bonds across the interface between mineral/inorganic components and organic components present in paints, adhesives, etc., or as the anchor for further steps of surface modifications.

    03 Surface engineering
  • 04 Air/Water or Liquid/Liquid Interface

    The air/water interface is of elementary interest in biophysics as well as in industrial applications. Brewster angle/LIQUID microscopy (BAM) is a powerful technique that allows for real-time visualization of Langmuir-Blodgett monolayers.

    04 Air/Water or Liquid/Liquid Interface
  • 05 Bio Interfaces

    Biological applications demand high sensitivity observation techniques. Additionally, the environment needs to be controllable in order to avoid influencing or damaging the behavior of observed materials. Imaging Ellipsometry offers highest sensitivity for thickness or surface coverage of mono- as well as sub-monolayers with microscopic resolution.

    05 Bio Interfaces
  • 06 Organic electronics, solar cells

    Considering that the optimal parameters play a central role in understanding and tailoring the properties of thin conductive polymers and that microscopic applications such as solar cells or OLEDs are increasingly coming to the fore, imaging ellipsometry is the method of choice to determine these parameters.

    06 Organic electronics, solar cells
  • 07 Anisotropic films

    Anisotropic micro crystals show high potential for the applications in e.g. microelectronic devices and flexible electronics. Most organic single crystals indicate a highly anisotropic optical behavior. Regarding anisotropic samples, the refractive index depends on the polarization of light and direction of propagation.

    07 Anisotropic films
  • 08 Various other applications

    A wide selection of samples with structures can be visualized and measured with the unique technique of imaging ellipsometry. If you do not find your application in this overview, feel free to contact us for specific information.

    08 Various other applications

Key Features

The Highest Lateral Ellipsometric Resolution

The combination of microscopy and auto-nulling ellipsometry allows a lateral ellipsometric resolution as small as 1 micron.

Imaging Ellipsometry in the Wavelength Range of 190 to 2750 nm​

With the use of a grating monochromator now continuous spectroscopic measurements are possible. ​Spectroscopic imaging ellipsometry in the wavelength range from 190 nm to 2750 nm provides pictures and ellipsometric micro-maps of your samples over a wide wavelength range.

Technology Integration Platform​

The technology integration platform allows the adaption of various alternative measurement technologies to receive even more information from your sample. Implementation of complementary technologies e.g. Raman, AFM, etc. provides even more information on your sample.

Various Unique Features

A variety of further new features and accessories enable ellipsometry for new applications. An interesting range of accessories enables the instrument to work in a large variety of applications (SPR or solid/ liquid cells, light guides for liquid/liquid interfaces, microfluidic, temperature control, electrochemistry cells, and many more).

Applications

Perfect for Diverse Applications