Park NX20 Lite is a cost-effective yet advanced AFM system, offering top performance for inspecting large samples. This technologically advanced AFM is tailored for the inspection of large samples and boasts a range of innovative features.
The Park NX20 Lite includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers. Its reasonable price and robust feature set also make it one of the best value large-sample AFMs in the industry.
- Automated imaging of multiple samples in one pass - Specially designed multi-sample chuck for the loading of up to 16 individual samples - Fully motorized XY sample stage travels up to 150 mm x 150 mm Using the motorized sample stage, MultiSample Scan™ enables programmable multiple region imaging in step-and-scan automation. The registration of multiple scan positions is easily carried out by either entering sample-stage coordinates or sample de-skewing by two reference points. This automated feature greatly increases productivity by reducing the need for your interaction during the scan process.
- Two independent, closed-loop XY and Z flexure scanners - Flat and orthogonal XY scan with low residual bow - More accurate height measurements enabled by NX electronic controller without any need for software processing
Park AFMs are equipped with the most effective low noise Z detectors in the field, with a noise of 0.02 nm over large bandwidth. This produces highly accurate sample topography and no edge overshoot. Just one of the many ways Park NX series saves you time and gives you better data.
Park NX20 produces data you can trust, replicate, and publish at the highest nano resolution. It is equipped with the most effective low-noise Z detectors in the field, with a noise of 0.02 nm over a large bandwidth. This produces highly accurate sample topography and no edge overshoot. Just one of the many ways Park NX20 saves you time and gives you better data.
Park NX20 is meticulously crafted to address the demands of diverse metrology and analysis applications for large samples. It stands out with its comprehensive range of modes, presenting an extensive toolkit for researchers across various fields. From standard imaging to electrochemical analysis, the instrument seamlessly supports a multitude of AFM modes, showcasing its adaptability to a wide array of applications. With Park NX20, researchers can confidently explore and delve into their scientific inquiries, benefiting from a versatile and reliable tool that enhances the precision and efficiency of their work.
Park NX20 allows users to effortlessly tailor settings for their unique research environments, by offering a diverse range of options and accessories that make it seamlessly adapt to them: optimized options for thermal and chemical properties, etc.